PROCESS DEPENDENCE OF SOFT ERRORS INDUCED BY ALPHA PARTICLES, HEAVY IONS, AND HIGH ENERGY NEUTRONS ON FLIP FLOPS IN FDSOI

Process Dependence of Soft Errors Induced by Alpha Particles, Heavy Ions, and High Energy Neutrons on Flip Flops in FDSOI

Soft-error tolerance depending on threshold voltage of transistors was evaluated by α -particle, heavy-ion, and neutron irradiation.Three chips were fabricated, one embeds low-threshold general-purpose (GP) transistors and the others embed high-threshold low-power (LP) transistors in a 65 nm fully depleted silicon on insulator (FDSOI) proces

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